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. Ed(S): Dhia, Sonia Ben; Ramdani, Mohamed; Sicard, Etienne - Electromagnetic Compatibility of Integrated Circuits - 9781461498315 - V9781461498315
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Electromagnetic Compatibility of Integrated Circuits

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Description for Electromagnetic Compatibility of Integrated Circuits Paperback. Editor(s): Dhia, Sonia Ben; Ramdani, Mohamed; Sicard, Etienne. Num Pages: 486 pages, biography. BIC Classification: TJF; TJFC; TJFN; TRC; UGC. Category: (G) General (US: Trade). Dimension: 235 x 155 x 25. Weight in Grams: 741.

Electromagnetic Compatibility of Integrated Circuits: Techniques for Low Emission and Susceptibility focuses on the electromagnetic compatibility of integrated circuits. The basic concepts, theory, and an extensive historical review of integrated circuit emission and susceptibility are provided. Standardized measurement methods are detailed through various case studies. EMC models for the core, I/Os, supply network, and packaging are described with applications to conducted switching noise, signal integrity, near-field and radiated noise. Case studies from different companies and research laboratories are presented with in-depth descriptions of the ICs, test set-ups, and comparisons between measurements and simulations. Specific guidelines for achieving low emission and susceptibility ... Read more

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Product Details

Format
Paperback
Publication date
2014
Publisher
Birkhauser Boston Inc United States
Number of pages
486
Condition
New
Number of Pages
473
Place of Publication
New York, NY, United States
ISBN
9781461498315
SKU
V9781461498315
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15

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