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VLSI Design for Manufacturing: Yield Enhancement
Director, Stephen W.; Maly, Wojciech; Strojwas, Andrzej J.
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Description for VLSI Design for Manufacturing: Yield Enhancement
Paperback. Series: The Springer International Series in Engineering and Computer Science. Num Pages: 292 pages, biography. BIC Classification: THR; TJFC. Category: (G) General (US: Trade). Dimension: 235 x 155 x 17. Weight in Grams: 474.
One of the keys to success in the IC industry is getting a new product to market in a timely fashion and being able to produce that product with sufficient yield to be profitable. There are two ways to increase yield: by improving the control of the manufacturing process and by designing the process and the circuits in such a way as to minimize the effect of the inherent variations of the process on performance. The latter is typically referred to as "design for manufacture" or "statistical design". As device sizes continue to shrink, the effects of the inherent fluctuations ... Read more
One of the keys to success in the IC industry is getting a new product to market in a timely fashion and being able to produce that product with sufficient yield to be profitable. There are two ways to increase yield: by improving the control of the manufacturing process and by designing the process and the circuits in such a way as to minimize the effect of the inherent variations of the process on performance. The latter is typically referred to as "design for manufacture" or "statistical design". As device sizes continue to shrink, the effects of the inherent fluctuations ... Read more
Product Details
Format
Paperback
Publication date
2011
Publisher
Springer-Verlag New York Inc. United States
Number of pages
292
Condition
New
Series
The Springer International Series in Engineering and Computer Science
Number of Pages
292
Place of Publication
New York, NY, United States
ISBN
9781461288169
SKU
V9781461288169
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
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