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Vth International Congress on X-Ray Optics and Microanalysis
. Ed(S): Mollenstedt, G.; Gaukler, K. H.
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Description for Vth International Congress on X-Ray Optics and Microanalysis
paperback. Editor(s): Mollenstedt, G.; Gaukler, K. H. Num Pages: 612 pages, 547 black & white illustrations, 1 colour illustration, biography. BIC Classification: PH. Category: (P) Professional & Vocational. Dimension: 279 x 210 x 32. Weight in Grams: 1526.
The Fifth International Congress on X-Ray Optics and Microanalysis was organized by the Institute of Applied Physics at Tübingen University in Western Germany from September 9th through 14th, 1968. Since 1956, when the First Conference was arranged in Cambridge, England by one of the pioneers in this field, V. E. CossLETT, the experts in the fields of X-Ray Optics and Microanalysis have met every third year to exchange their scientific experiences. Later meetings were held at Uppsala, Sweden in 1959, at Stanford, California in 1962, and at Orsay, Francein 1965. The participants in the 1968 Conference came from the following ... Read more
The Fifth International Congress on X-Ray Optics and Microanalysis was organized by the Institute of Applied Physics at Tübingen University in Western Germany from September 9th through 14th, 1968. Since 1956, when the First Conference was arranged in Cambridge, England by one of the pioneers in this field, V. E. CossLETT, the experts in the fields of X-Ray Optics and Microanalysis have met every third year to exchange their scientific experiences. Later meetings were held at Uppsala, Sweden in 1959, at Stanford, California in 1962, and at Orsay, Francein 1965. The participants in the 1968 Conference came from the following ... Read more
Product Details
Format
Paperback
Publication date
2013
Publisher
Springer-Verlag Berlin and Heidelberg GmbH & Co. KG Germany
Number of pages
612
Condition
New
Number of Pages
612
Place of Publication
Berlin, Germany
ISBN
9783662121108
SKU
V9783662121108
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
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