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X-Ray Diffraction: Structure, Principles & Applications
Kaimin Shih (Ed.)
€ 230.68
€ 157.04
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Description for X-Ray Diffraction: Structure, Principles & Applications
Hardback. Editor(s): Shih, Kaimin. Num Pages: 248 pages, illustrations. BIC Classification: TGM. Category: (G) General (US: Trade). Dimension: 258 x 182 x 21. Weight in Grams: 690.
An important milestone in the history of science, the diffraction of X-rays, was observed by Max von Laue in 1912. In the last 100 years, X-ray diffraction (XRD) studies have revealed highly valuable information about many ordered atomic structures seen in a variety of common materials. The understanding of material structures opened the door to the reliable application of these materials and allowed scientific discussions about material properties and structural features to become possible. Besides playing this crucial role in history, XRD has now also successfully transformed itself into a method in the forefront of extending much of our knowledge ... Read more
An important milestone in the history of science, the diffraction of X-rays, was observed by Max von Laue in 1912. In the last 100 years, X-ray diffraction (XRD) studies have revealed highly valuable information about many ordered atomic structures seen in a variety of common materials. The understanding of material structures opened the door to the reliable application of these materials and allowed scientific discussions about material properties and structural features to become possible. Besides playing this crucial role in history, XRD has now also successfully transformed itself into a method in the forefront of extending much of our knowledge ... Read more
Product Details
Publisher
Nova Science Publishers Inc United States
Number of pages
248
Format
Hardback
Publication date
2013
Condition
New
Weight
690g
Number of Pages
248
Place of Publication
New York, United States
ISBN
9781628085914
SKU
V9781628085914
Shipping Time
Usually ships in 5 to 9 working days
Ref
99-1
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