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X-Ray Diffraction by Disordered Lamellar Structures
. Ed(S): Drits, Victor A.; Tchoubar, Cyril; Guinier, Andre
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Description for X-Ray Diffraction by Disordered Lamellar Structures
Paperback. Editor(s): Drits, Victor A.; Tchoubar, Cyril; Guinier, Andre. Translator(s): Setton, R. Num Pages: 388 pages, biography. BIC Classification: PHFC; PNK; PNV. Category: (P) Professional & Vocational. Dimension: 234 x 156 x 20. Weight in Grams: 591.
New methods for the determination of the nature, proportion, and distribution of structural defects in microcrystallized lamellar systems are of utmost importance not only to experimentalists but also to theoreticians. Mathematical formalism - indispensable for such analyses - is well-illustrated by various examples, allowing this method to be easily adopted and even to be applied to other solids with lamellar or pseudo-lamellar structures.
New methods for the determination of the nature, proportion, and distribution of structural defects in microcrystallized lamellar systems are of utmost importance not only to experimentalists but also to theoreticians. Mathematical formalism - indispensable for such analyses - is well-illustrated by various examples, allowing this method to be easily adopted and even to be applied to other solids with lamellar or pseudo-lamellar structures.
Product Details
Format
Paperback
Publication date
2011
Publisher
Springer-Verlag Berlin and Heidelberg GmbH & Co. KG Germany
Number of pages
388
Condition
New
Number of Pages
371
Place of Publication
Berlin, Germany
ISBN
9783642748042
SKU
V9783642748042
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
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