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. Ed(S): Thieme, Jurgen; Schmahl, Gunter; Rudolph, Dietbert; Umbach, Eberhard - X-Ray Microscopy and Spectromicroscopy - 9783642721083 - V9783642721083
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X-Ray Microscopy and Spectromicroscopy

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Description for X-Ray Microscopy and Spectromicroscopy Mixed media pr. Editor(s): Thieme, Jurgen; Schmahl, Gunter; Rudolph, Dietbert; Umbach, Eberhard. Num Pages: 402 pages, 400 black & white illustrations, 14 black & white tables, biography. BIC Classification: PHFC; PHVN; TGM; TTB. Category: (P) Professional & Vocational. Dimension: 235 x 155 x 21. Weight in Grams: 623.
This book is based on presentations to the International Conference of X-Ray Micro­ scopy and Spectromicroscopy, XRM 96, which took place in Wiirzburg, August 19- 23, 1996. The conference also celebrated the lOOth anniversary of the discovery of X­ rays by Wilhelm Conrad Rontgen on November 8, 1895, in Wiirzburg. This book contains state-of-the-art reviews and up-to-date progress reports in the field of X-ray microscopy and spectromicroscopy, including related new X-ray optics and X-ray sources. It reflects the lively activities within a relatively new field of science which combines the development of new instruments and methods with their applications to ... Read more

Product Details

Publication date
2014
Publisher
Springer-Verlag Berlin and Heidelberg GmbH & Co. KG Germany
Number of pages
402
Condition
New
Number of Pages
383
Format
Paperback
Place of Publication
Berlin, Germany
ISBN
9783642721083
SKU
V9783642721083
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15

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