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. Ed(S): Sayre, David; Howells, Malcolm; Kirz, Janos; Rarback, Harvey - X-Ray Microscopy II - 9783662144909 - V9783662144909
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X-Ray Microscopy II

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Description for X-Ray Microscopy II Paperback. Editor(s): Sayre, David; Howells, Malcolm; Kirz, Janos; Rarback, Harvey. Series: Springer Series in Optical Sciences. Num Pages: 469 pages, 286 black & white illustrations, 2 colour illustrations, biography. BIC Classification: PDND. Category: (P) Professional & Vocational. Dimension: 229 x 152 x 24. Weight in Grams: 686.
This volume is based on papers presented at the International Symposium on X-Ray Microscopy held at Brookhaven National Laboratory, Upton NY, August 31-September 4, 1987. Previous recent symposia on the sub­ ject were held in New York in 1979, Gottingen in 1983 and Taipei in 1986. Developments in x-ray microscopy continue at a rapid pace, with im­ portant advances in all major areas: x-ray sources, optics and components, and microscopes and imaging systems. Taken as a whole, the work pre­ sented here emphasizes three major directions: (a) improvements in the capability and image-quality of x-ray microscopy, expressed principally in systems ... Read more

Product Details

Format
Paperback
Publication date
2013
Publisher
Springer-Verlag Berlin and Heidelberg GmbH & Co. KG Germany
Number of pages
469
Condition
New
Series
Springer Series in Optical Sciences
Number of Pages
455
Place of Publication
Berlin, Germany
ISBN
9783662144909
SKU
V9783662144909
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15

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