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Chang Shih-Lin - X-Ray Multiple-Wave Diffraction - 9783642059476 - V9783642059476
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X-Ray Multiple-Wave Diffraction

€ 195.70
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Description for X-Ray Multiple-Wave Diffraction Paperback. Series: Springer Series in Solid-State Sciences. Num Pages: 448 pages, biography. BIC Classification: PNT. Category: (P) Professional & Vocational. Dimension: 234 x 156 x 23. Weight in Grams: 688.
X-ray multiple-wave diffraction, sometimes called multiple diffraction or N-beam diffraction, results from the scattering of X-rays from periodic two­ or higher-dimensional structures, like 2-d and 3-d crystals and even quasi­ crystals. The interaction of the X-rays with the periodic arrangement of atoms usually provides structural information about the scatterer. Unlike the usual Bragg reflection, the so-called two-wave diffraction, the multiply diffracted intensities are sensitive to the phases of the structure factors in­ volved. This gives X-ray multiple-wave diffraction the chance to solve the X-ray phase problem. On the other hand, the condition for generating an X­ ray multiple-wave diffraction is ... Read more

Product Details

Format
Paperback
Publication date
2010
Publisher
Springer-Verlag Berlin and Heidelberg GmbH & Co. KG Germany
Number of pages
448
Condition
New
Series
Springer Series in Solid-State Sciences
Number of Pages
436
Place of Publication
Berlin, Germany
ISBN
9783642059476
SKU
V9783642059476
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15

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