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Zhang, Jian Cheng; Styblinski, M. A. - Yield and Variability Optimization of Integrated Circuits - 9781461359357 - V9781461359357
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Yield and Variability Optimization of Integrated Circuits

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Description for Yield and Variability Optimization of Integrated Circuits Paperback. Num Pages: 234 pages, biography. BIC Classification: THR; TJFC. Category: (G) General (US: Trade). Dimension: 235 x 155 x 13. Weight in Grams: 397.
Traditionally, Computer Aided Design (CAD) tools have been used to create the nominal design of an integrated circuit (IC), such that the circuit nominal response meets the desired performance specifications. In reality, however, due to the disturbances ofthe IC manufacturing process, the actual performancesof the mass produced chips are different than those for the nominal design. Even if the manufacturing process were tightly controlled, so that there were little variations across the chips manufactured, the environmentalchanges (e. g. those oftemperature, supply voltages, etc. ) would alsomakethe circuit performances vary during the circuit life span. Process-related performance variations may lead to ... Read more

Product Details

Format
Paperback
Publication date
1995
Publisher
Springer-Verlag New York Inc. United States
Number of pages
234
Condition
New
Number of Pages
234
Place of Publication
New York, NY, United States
ISBN
9781461359357
SKU
V9781461359357
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15

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